@ARTICLE{Żołądź_Mirosław_A_2025,
 author={Żołądź, Mirosław},
 volume={33},
 number={1},
 pages={e153243},
 journal={Opto-Electronics Review},
 howpublished={online},
 year={2025},
 publisher={Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology},
 abstract={The paper presents an X-ray camera for testing moving objects. A typical application of such cameras is scanning products on an industrial production line. Currently, the most popular device detecting radiation in this type of camera consists of a pixel line based on scintillator detectors. Unfortunately, increasing its resolution automatically involves reducing the pixel size and reducing the signal-to-noise ratio. This is where the time domain integration method comes in handy, increasing the resolution without degrading the signal-to-noise ratio. The camera presented in this paper is based on an application-specific integrated circuit dedicated to this purpose. The application-specific integrated circuit core is a pixel matrix operating in a single-photon counting mode. Its architecture was designed to implement the time domain integration method and construct high-resolution cameras with a large scanning area. The article also describes the hardware and software of the application-specific integrated circuit readout system.},
 title={A camera for scanning objects in motion based on an integrated detection system working in on-chip TDI mode},
 type={Article},
 URL={http://journals.pan.pl/Content/133659/PDF/OPELRE_2025_33_1_M_Zoladz.pdf},
 doi={10.24425/opelre.2024.153243},
 keywords={X-rays, application-specific integrated circuit, single-photon counting, time domain integration},
}