@ARTICLE{Mleczko_Krzysztof_Noise_2017,
 author={Mleczko, Krzysztof and Ptak, Piotr and Zawiślak, Zbigniew and Słoma, Marcin and Jakubowska, Małgorzata and Kolek, Andrzej},
 volume={vol. 24},
 number={No 4},
 journal={Metrology and Measurement Systems},
 pages={585–590},
 howpublished={online},
 year={2017},
 publisher={Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation},
 abstract={Graphene is a very promising material for potential applications in many fields. Since manufacturing technologies of graphene are still at the developing stage, low-frequency noise measurements as a tool for evaluating their quality is proposed. In this work, noise properties of polymer thick-film resistors with graphene nano-platelets as a functional phase are reported. The measurements were carried out in room temperature. 1/f noise caused by resistance fluctuations has been found to be the main component in the specimens. The parameter values describing noise intensity of the polymer thick-film specimens have been calculated and compared with the values obtained for other thick-film resistors and layers used in microelectronics. The studied polymer thick-film specimens exhibit rather poor noise properties, especially for the layers with a low content of the functional phase.},
 title={Noise Properties of Graphene-Polymer Thick-Film Resistors},
 URL={http://journals.pan.pl/Content/106330/PDF/10.1515-mms-2017-0051-paper%2001.pdf},
 doi={10.1515/mms-2017-0051},
 keywords={graphene, polymer thick-film resistor, low-frequency noise, noise measurements},
}