@ARTICLE{Szybiński_Krzysztof_Contactless_2020,
 author={Szybiński, Krzysztof},
 volume={vol. 27},
 number={No 3},
 journal={Metrology and Measurement Systems},
 pages={427-439},
 howpublished={online},
 year={2020},
 publisher={Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation},
 abstract={In this paper the problem of resistance measurement of ultrathin conductive lines on dielectric substrates dedicated for printing electronic industry is discussed. The measured line is transformed in a non-invasive way into a resonance circuit. By using a magnetic coupling between the source line and the tested line, the resistance measurement can be performed non-invasively, i:e. without a mechanical contact. The proposed contactless resistance measurement method is based on the resonance quality factor estimation and it is an example of the inverse problem in metrology.},
 type={Article},
 title={Contactless method for resistance measurement of ultra-thin printed and conductive lines},
 URL={http://journals.pan.pl/Content/117627/PDF/art04.pdf},
 doi={10.24425/mms.2020.134592},
 keywords={inkjet printing electronics, resistance measurements, micrometer conducting lines, contactless method, resonance circuits},
}