@ARTICLE{Achtenberg _Krzysztof_Application_2022,
 author={Achtenberg , Krzysztof and Mikołajczyk, Janusz and Bielecki, Zbigniew},
 volume={30},
 number={2},
 journal={Opto-Electronics Review},
 pages={e141126},
 howpublished={online},
 year={2022},
 publisher={Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology},
 abstract={The paper presents noise measurements in low-resistance photodetectors using a cross-correlation-based transimpedance amplifier. Such measurements usually apply a transimpedance amplifier design to provide a current fluctuation amplification. In the case of low-resistance sources, the measurement system causes additional relevant system noise which can be higher than noise generated in a tested detector. It mainly comes from the equivalent input voltage noise of the transimpedance amplifier. In this work, the unique circuit and a three-step procedure were used to reduce the floor noise, covering the measured infrared detector noise, mainly when operating with no-bias or low-bias voltage. The modified circuit and procedure to measure the noise of unbiased and biased detectors characterized by resistances much lower than 100 Ω were presented. Under low biases, the reference low-resistance resistors tested the measurement system operation and techniques. After the system verification, noise characteristics in low-resistance InAs and InAsSb infrared detectors were also measured.},
 type={Article},
 title={Application of cross-correlation-based transimpedance amplifier in InAs and InAsSb IR detectors noise measurements},
 URL={http://journals.pan.pl/Content/123016/PDF/OPELRE_2022_30_2_K_Achtenberg.pdf},
 doi={10.24425/opelre.2022.141126},
 keywords={cross-correlation, IR detectors, noise, transimpedance amplifier, InAs, InAsSb},
}