@ARTICLE{Widianto_Build_2022,
 author={Widianto and Chasrun, H.M. and Lis, Robert},
 volume={vol. 68},
 number={No 3},
 journal={International Journal of Electronics and Telecommunications},
 pages={619-623},
 howpublished={online},
 year={2022},
 publisher={Polish Academy of Sciences Committee of Electronics and Telecommunications},
 abstract={A testbench is built to verify a functionality of a shift register IC (Integrated Circuit) from stuck-at-faults, stuck-at-1 as well as stuck-at-0. The testbench is supported by components, i.e., generator, interface, driver, monitor, scoreboard, environment, test, and testbench top. The IC consists of sequential logic circuits of D-type flip-flops. The faults may occur at interconnects between the circuits inside the IC. In order to examine the functionality from the faults, both the testbench and the IC are designed using SystemVerilog and simulated using Questasim simulator. Simulation results show the faults may be detected by the testbench. Moreover, the detected faults may be indicated by error statements in transcript results of the simulator.},
 type={Article},
 title={Build Testbenches for Verification in Shift Register ICs using SystemVerilog},
 URL={http://journals.pan.pl/Content/124273/PDF-MASTER/21-3488-12094-1-PB.pdf},
 doi={10.24425/ijet.2022.141281},
 keywords={testbench, verification, shift register IC, stuck-atfaults, SystemVerilog},
}