TY - JOUR L1 - http://journals.pan.pl/Content/107040/PDF/Journal10178-VolumeXVII%20Issue1_05%20paper.pdf L2 - http://journals.pan.pl/Content/107040 PY - 2010 IS - No 1 DO - 10.2478/v10178-010-0005-9 A1 - Weckenmann, Albert A1 - Bernstein, Johannes PB - Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation DA - 2010 T1 - Optical Multi-Sensor Metrology for Extruded Profiles UR - http://journals.pan.pl/dlibra/publication/edition/107040 T2 - Metrology and Measurement Systems ER -