TY - JOUR N2 - The paper presents research results of multilayer systems composed of alternate Cu/Ni layers. The layers thickness obtained by the galvanic treatment was determined by using the transmission electron microscopy and X-ray diffraction method in the grazing incidence diffraction geometry. The surface morphology was observed using scanning electron microscope with EDS microanalysis. Observation of the surface topography of systems using the atomic force microscope was also carried out. L1 - http://journals.pan.pl/Content/109185/PDF/AMM-2018-4-66-Spilka.pdf L2 - http://journals.pan.pl/Content/109185 PY - 2018 IS - No 4 EP - 2073 DO - 10.24425/amm.2018.125144 KW - Cu/Ni multilayer systems KW - galvanic method KW - thickness measurement KW - surface morphology and topography A1 - Spilka, M. A1 - Babilas, R. A1 - Ratuszek, W. A1 - Kowalska, J. A1 - Matus, K. PB - Institute of Metallurgy and Materials Science of Polish Academy of Sciences PB - Committee of Materials Engineering and Metallurgy of Polish Academy of Sciences VL - vol. 63 DA - 2018.12.12 T1 - Fabrication of Multilayer Cu/Ni Systems with Nanometric Layers by Electrolysis Method SP - 2067 UR - http://journals.pan.pl/dlibra/publication/edition/109185 T2 - Archives of Metallurgy and Materials ER -