TY - JOUR N2 - Low-frequency noise measurements have long been recognized as a valuable tool in the examination of quality and reliability of metallic interconnections in the microelectronic industry. While characterized by very high sensitivity, low-frequency noise measurements can be extremely time-consuming, especially when tests have to be carried out over an extended temperature range and with high temperature resolution as it is required by some advanced characterization approaches recently proposed in the literature. In order to address this issue we designed a dedicated system for the characterization of the low-frequency noise produced by a metallic line vs temperature. The system combines high flexibility and automation with excellent background noise levels. Test temperatures range from ambient temperature up to 300◦C. Measurements can be completely automated with temperature changing in pre-programmed steps. A ramp temperature mode is also possible that can be used, with proper caution, to virtually obtain a continuous plot of noise parameters vs temperature. L1 - http://journals.pan.pl/Content/110249/PDF/art_02.pdf L2 - http://journals.pan.pl/Content/110249 PY - 2019 IS - No 1 EP - 21 DO - 10.24425/mms.2019.126336 KW - low-frequency noise measurements KW - electron devices reliability KW - electro-migration KW - dedicated instrumentation A1 - Scandurra, Graziella A1 - Beyne, Sofie A1 - Giusi, Gino A1 - Ciofi, Carmine PB - Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation VL - vol. 26 DA - 2019.04.01 T1 - On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low-frequency noise measurements SP - 13 UR - http://journals.pan.pl/dlibra/publication/edition/110249 T2 - Metrology and Measurement Systems ER -