TY - JOUR N2 - The paper deals with a multiple fault diagnosis of DC transistor circuits with limited accessible terminals for measurements. An algorithm for identifying faulty elements and evaluating their parameters is proposed. The method belongs to the category of simulation before test methods. The dictionary is generated on the basis of the families of characteristics expressing voltages at test nodes in terms of circuit parameters. To build the fault dictionary the n-dimensional surfaces are approximated by means of section-wise piecewise-linear functions (SPLF). The faulty parameters are identified using the patterns stored in the fault dictionary, the measured voltages at the test nodes and simple computations. The approach is described in detail for a double and triple fault diagnosis. Two numerical examples illustrate the proposed method. L1 - http://journals.pan.pl/Content/110724/PDF/(56-1)53.pdf L2 - http://journals.pan.pl/Content/110724 PY - 2008 IS - No 1 EP - 57 KW - fault diagnosis KW - fault dictionary KW - analog circuits KW - multiple faults A1 - HaƂgas, S. VL - vol. 56 DA - 2008 T1 - Multiple soft fault diagnosis of nonlinear circuits using the fault dictionary approach SP - 53 UR - http://journals.pan.pl/dlibra/publication/edition/110724 T2 - Bulletin of the Polish Academy of Sciences Technical Sciences ER -