TY - JOUR N2 - In this paper an analysis of the surface properties of (Ti,Pd,Eu)Ox thin films prepared by magnetron sputtering has been described. In particular, the results of composition and structure investigations were studied in relation to the surface state and optical properties. It was found that (Ti,Pd,Eu)Ox film was nanocrystalline and had a rutile structure. The average crystallites size was equal to 7.8 nm. Films were homogeneous and had densely packed grains. Investigation of the surface properties by XPS showed that titanium was present at 4+ state (in the TiO2form), palladium occurred as PdO2(also at 4+ state), while europium was in Eu2O3form (at 3+ state). In comparison with the unmodiffied TiO2, the coating with Pd and Eu additives had a rather high transparency (approx. 47%) in the visible light range, its optical absorption edge was shifted towards into the longer wavelengths (from 345 nm to 452 nm), and the width of optical energy gap Egopt was nearly twice lower (1.82 eV). Besides, the resistivity of (Ti,Pd,Eu)Ox at room temperature was 1×103 Wcm. In the case of the film as-deposited on Si substrate (p-type) the generation of photocurrent as a response to light beam excitation (λexc = 527 nm) was observed. L1 - http://journals.pan.pl/Content/115974/PDF-MASTER/pan_doi_blank.pdf L2 - http://journals.pan.pl/Content/115974 PY - 2016 IS - No 1 EP - 19 KW - thin film KW - TiO2 KW - palladium KW - europium KW - transparent oxide semiconductor (TOS) A1 - Wojcieszak, D. A1 - Kaczmarek, D. A1 - Domaradzki, J. PB - Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology VL - vol. 24 DA - 08.02.2016 T1 - Analysis of surface properties of semiconducting (Ti,Pd,Eu)Oxthin films SP - 15 UR - http://journals.pan.pl/dlibra/publication/edition/115974 T2 - Opto-Electronics Review ER -