TY - JOUR N2 - Studies of electrical properties, including noise properties, of thick-film resistors prepared from various resistive and conductive materials on LTCC substrates have been described. Experiments have been carried out in the temperature range from 300 K up to 650 K using two methods, i.e. measuring (i) spectra of voltage fluctuations observed on the studied samples and (ii) the current noise index by a standard meter, both at constant temperature and during a temperature sweep with a slow rate. The 1/f noise component caused by resistance fluctuations occurred to be dominant in the entire range of temperature. The dependence of the noise intensity on temperature revealed that a temperature change from 300 K to 650 K causes a rise in magnitude of the noise intensity approximately one order of magnitude. Using the experimental data, the parameters describing noise properties of the used materials have been calculated and compared to the properties of other previously studied thick-film materials. L1 - http://journals.pan.pl/Content/90212/PDF/Journal10178-VolumeXXI%20Issue1_02.pdf L2 - http://journals.pan.pl/Content/90212 PY - 2014 IS - No 1 EP - 26 DO - 10.2478/mms-2014-0002 KW - noise spectroscopy KW - low-frequency noise KW - resistance noise KW - low-frequency noise measurement KW - thick-film resistors A1 - Stadler, Adam Witold A1 - Zawiślak, Zbigniew A1 - Dziedzic, Andrzej A1 - Nowak, Damian PB - Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation DA - 2014 T1 - NOISE SPECTROSCOPY OF RESISTIVE COMPONENTS AT ELEVATED TEMPERATURE SP - 15 UR - http://journals.pan.pl/dlibra/publication/edition/90212 T2 - Metrology and Measurement Systems ER -