TY - JOUR N2 - Correct incipient identification of an analog circuit fault is conducive to the health of the analog circuit, yet very difficult. In this paper, a novel approach to analog circuit incipient fault identification is presented. Time responses are acquired by sampling outputs of the circuits under test, and then the responses are decomposed by the wavelet transform in order to generate energy features. Afterwards, lower-dimensional features are produced through the kernel entropy component analysis as samples for training and testing a one-against-one least squares support vector machine. Simulations of the incipient fault diagnosis for a Sallen-Key band-pass filter and a two-stage four-op-amp bi-quad low-pass filter demonstrate the diagnosing procedure of the proposed approach, and also reveal that the proposed approach has higher diagnosis accuracy than the referenced methods. L1 - http://journals.pan.pl/Content/90329/PDF/Journal10178-VolumeXXII%20Issue2_07paper.pdf.pdf L2 - http://journals.pan.pl/Content/90329 PY - 2015 IS - No 2 EP - 262 DO - 10.1515/mms-2015-0025 KW - analog circuits KW - incipient fault diagnosis KW - wavelet transform KW - kernel entropy component analysis KW - least squares support vector machine A1 - Zhang, Chaolong A1 - He, Yigang A1 - Zuo, Lei A1 - Wang, Jinping A1 - He, Wei PB - Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation VL - vol. 22 DA - 2015[2015.01.01 AD - 2015.12.31 AD] T1 - A Novel Approach To Diagnosis Of Analog Circuit Incipient Faults Based On KECA And OAO LSSVM SP - 251 UR - http://journals.pan.pl/dlibra/publication/edition/90329 T2 - Metrology and Measurement Systems ER -