Two Heuristic Algorithms for Test Point Selection in Analog Circuit Diagnoses

Journal title

Metrology and Measurement Systems




No 1



analog circuit diagnosis ; fault diagnosis ; testing ; search methods ; heuristic optimization

Divisions of PAS

Nauki Techniczne




Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation




Artykuły / Articles


DOI: 10.2478/v10178-011-0011-6


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