Tytuł artykułu

DAC Testing Using Modulated Signals

Tytuł czasopisma

Metrology and Measurement Systems

Rocznik

2011

Numer

No 2

Autorzy

Fexa, Pavel ; Vedral, Josef ; Svatoš, Jakub

Słowa kluczowe

Digital-to-analog converter ; ENOB ; Signal-to-noise and distortion - SINAD ; FFT analysis ; Crest Factor (CF)

Wydział PAN

Nauki Techniczne

Zakres

283-294

Wydawca

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Data

2011

Typ

Artykuły / Articles

Identyfikator

DOI: 10.2478/v10178-011-0010-0 ; ISSN 2080-9050, e-ISSN 2300-1941

Źródło

Metrology and Measurement Systems; 2011; No 2; 283-294

Referencje

DYNAD (2000). Methods and draft standards for the Dynamic characterization and Testing of Analogue to Digital Converters. <a target="_blank" href='http://paginas.fe.up.pt/~hsm/dynad/'>http://paginas.fe.up.pt/~hsm/dynad/</a> ; IEEE Standard 1241-2000. (2000). IEEE Standard and Terminology and Test Methods for Analog-to-Digital Converters. New York. ; IEEE P1658 TM/D03.6. (1988). Draft Standard for Terminology and Test Methods for Digital-to-Analog Converters. New York. ; Vedral J. (2009), Methods for economical test of dynamic parameters ADCs, Metrology and Measurement Systems, 15, 1, 161. ; Vedral J. (2008), Exponential Fit Test - Theoretical Analysis and Practically Implementation, null, 1033. ; Holcer R. (2003), DNL ADC Testing by the exponential shaped voltage, IEEE Transaction on Instrumentation and Measurement, 52, 3, 946, doi.org/10.1109/TIM.2003.814668 ; App. Note 641. (2002). ADC and DAC Glossary. <i>Sunnyvale: Maxim Integrated Products</i>, 22. ; Oppenheim A. (1989), Discrete-Time Signal Processing. ; Vedral J. (2010), Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 1, doi.org/10.1109/IMS3TW.2010.5503120 ; Dallet D. (2005), Dynamic characterisation of analogue-to-digital converters. ; Newkirk D. (2004), The ARRL Handbook for Radio Communications. ; Boashash B. (2003), Time-Frequency Signal Analysis and Processing - A Comprehensive Reference.