Tytuł artykułu

Soft Fault Clustering in Analog Electronic Circuits with the Use of Self Organizing Neural Network

Tytuł czasopisma

Metrology and Measurement Systems




No 4


Słowa kluczowe

fault detection ; parametric faults ; analogue electronic circuits ; self-organizing neural network

Wydział PAN

Nauki Techniczne




Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation




Artykuły / Articles


DOI: 10.2478/v10178-011-0054-8 ; ISSN 0860-8229


Metrology and Measurement Systems; 2011; No 4; 555-568


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