Title

Analog Circuit Fault Classification Using Improved One-Against-One Support Vector Machines

Journal title

Metrology and Measurement Systems

Yearbook

2011

Issue

No 4

Authors

Cui, Jiang ; Wang, Youren

Keywords

analog circuit ; fault classification ; Support Vector Machines classifier ; fault dictionary ; kernel parameter

Divisions of PAS

Nauki Techniczne

Coverage

569-582

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2011

Type

Artykuły / Articles

Identifier

DOI: 10.2478/v10178-011-0055-7 ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2011; No 4; 569-582

References

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