Details

Title

Some quantum limits for scaling of electronic devices – estimations and measurements

Journal title

Metrology and Measurement Systems

Yearbook

2012

Issue

No 3

Authors

Keywords

nanostructure ; quantum effect ; integrated circuits.

Divisions of PAS

Nauki Techniczne

Coverage

481-488

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2012

Type

Artykuły / Articles

Identifier

DOI: 10.2478/v10178-012-0041-8 ; ISSN 0860-8229

Source

Metrology and Measurement Systems; 2012; No 3; 481-488
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