Details Details PDF BIBTEX RIS Title Laser Reflectance Interferometry System with a 405 Nm Laser Diode for in Situ Measurements of CVD Diamond Thickness Journal title Metrology and Measurement Systems Yearbook 2013 Numer No 4 Authors Kraszewski, Maciej ; Bogdanowicz, Robert Keywords interferometry ; thin films ; CVD ; diamond ; in situ measurements Divisions of PAS Nauki Techniczne Coverage 543-554 Publisher Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation Date 2013 Type Artykuły / Articles Identifier DOI: 10.2478/mms-2013-0046 <div class="test"></div>