Title

Diagnosis of Soft Spot Short Defects in Analog Circuits Considering the Thermal Behaviour of the Chip

Journal title

Metrology and Measurement Systems

Yearbook

2016

Volume

vol. 23

Issue

No 2

Authors

Tadeusiewicz, Michał ; Hałgas, Stanisław

Keywords

analog circuits ; fault diagnosis ; short spot defects ; thermal effects

Divisions of PAS

Nauki Techniczne

Coverage

239-250

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2016.06.30

Type

Artykuły / Articles

Identifier

DOI: 10.1515/mms-2016-0023 ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2016; vol. 23; No 2; 239-250

References

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