Details

Title

Internal Friction of Li7La3Zr2O12 Based Lithium Ionic Conductors

Journal title

Archives of Metallurgy and Materials

Yearbook

2016

Issue

No 1 March

Authors

Divisions of PAS

Nauki Techniczne

Publisher

Institute of Metallurgy and Materials Science of Polish Academy of Sciences ; Committee of Materials Engineering and Metallurgy of Polish Academy of Sciences

Date

2016

Identifier

DOI: 10.1515/amm-2016-0009 ; e-ISSN 2300-1909

Source

Archives of Metallurgy and Materials; 2016; No 1 March

References

Allen (2012), Effect of substitution ( on the conductivity of, Power Sources, 3, 206. ; Wang (2013), Phase transition and conductivity improvement of tetragonal fast ionic electrolyte, Solid State Ionics, 9, 253. ; Rangasamy (2012), The role of Al and Li concentration on the formation of cubic garnet solid electrolyte State, Solid Ionics, 5, 206. ; Wang (2006), Phase transition process in oxide - ion conductors β - accessed by internal friction method, Appl Phys Lett, 12, 021904, doi.org/10.1063/1.2220056 ; Ramaswamy (2007), Fast lithium ion conduction in garnet - type, Angew Chem International edition, 1, 46. ; Wang (2009), Low frequency internal friction study of lithium - ion conductor, Mater Sci Eng, 13, 521. ; Geiger (2011), Crystal chemistry and stability of garnet fast lithium - ion conductor, Inorg Chem, 2, 1089, doi.org/10.1021/ic101914e ; Wang (2014), Correlation and mechanism of lithium ion diffusion with crystal structure in revealed by internal friction technique, Phys Chem Chem Phys, 11, 7006, doi.org/10.1039/C3CP55515A ; Xu (2012), Mechanisms of transport in garnet - type cubic xLa, Phys Rev B, 6, 85. ; Kumazaki (2011), High lithium ion conductive by inclusion of both Al and Si, Electrochem Commun, 4, 509, doi.org/10.1016/j.elecom.2011.02.035 ; Xia (2014), Correlation of lithium ionic diffusion with Nb concentration in xLa xNbxO evaluated by internal friction method, Chin Phys Lett, 14, 12. ; Murugan (2011), High conductive yttrium doped cubic lithium garnet, Electrochem Commun, 7, 1373, doi.org/10.1016/j.elecom.2011.08.014
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