Details

Title

Leakage Current Degradation Due to Ion Drift and Diffusion in Tantalum and Niobium Oxide Capacitors

Journal title

Metrology and Measurement Systems

Yearbook

2017

Volume

vol. 24

Issue

No 2

Authors

Keywords

niobium oxide capacitors ; tantalum capacitors ; leakage current ; ion diffusion ; ion drift

Divisions of PAS

Nauki Techniczne

Coverage

255–264

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2017.06.30

Type

Artykuły / Articles

Identifier

DOI: 10.1515/mms-2017-0034 ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2017; vol. 24; No 2; 255–264

References

Elhadidy (2015), Ion electromigration in CdTe Schottky metal - semiconductor - metal structure, Solid State Ionics, 278. ; Laleko (1982), Ionic current and kinetics of activation of the conductivity of anodic oxide films on tantalum in strong electric fields, Soviet Electrochemistry, 18, 743. ; Teverovsky (2010), Degradation of leakage currents in solid tantalum capacitors under steady - state bias conditions Electronic Components and Technology th, Conference Proc, 752. ; Smulko (2011), Acoustic emission for detecting deterioration of capacitors under aging, Microelectronics Reliability, 51, 621. ; Szewczyk (2016), Voltage Dependence of Supercapacitor Capacitance, Metrol Meas Syst, 23, 403. ; Pavelka (2002), Noise and transport characterisation of tantalum capacitors, Microelectronics Reliability, 42, 841. ; Smulko (2012), Quality testing methods of foil - based capacitors, Microelectronics Reliability, 52, 603. ; Chaneliere (1998), Tantalum pentoxide thin films for advanced dielectric applications Material and, Science Eng, 269. ; Sedlakova (2016), Supercapacitor Degradation Assesment by Power Cycling and Calendar Life Tests, Metrol Meas Syst, 23, 345.

Open Access Policy

Metrology and Measurement Systems is an open access journal with all content available with no charge in full text version.


The journal content is available under the license CC BY-NC-ND 4.0. https://creativecommons.org/licenses/by-nc-nd/4.0/
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