Szczegóły
Tytuł artykułu
Measurement of Surface Profile and Surface Roughness of Fibre-Optic Interconnect by Fast Fourier TransformTytuł czasopisma
Metrology and Measurement SystemsRocznik
2017Wolumin
vol. 24Numer
No 2Autorzy
Słowa kluczowe
Surface profile ; surface roughness ; fibre end-face ; Fast Fourier transformWydział PAN
Nauki TechniczneZakres
381–390Wydawca
Polish Academy of Sciences Committee on Metrology and Scientific InstrumentationData
2017.06.30Typ
Artykuły / ArticlesIdentyfikator
DOI: 10.1515/mms-2017-0028 ; ISSN 2080-9050, e-ISSN 2300-1941Źródło
Metrology and Measurement Systems; 2017; vol. 24; No 2; 381–390Referencje
Lin (2010), Three - dimensional profile measurement of small lens using subpixel localization with color grating, Optik, 121, 2122. ; Zhao (2015), Automatic laser interferometer and vision measurement system for stripe rod calibration, Metrol Meas Syst, 22, 491. ; Wang (2006), measurement of crater wear by phase shifting method, Wear, 261. ; Takeda (1983), Fourier transform profilometry for the automatic measurement of object shapes, Applied Optics, 3, 3977. ; Tien (2009), The measurement of surface roughness of optical thin films based on fast Fourier transform Solid, Thin Films, 17, 517. ; Lu (2013), A novel automatic method of fringe counter for equally tilting fringe, Optik, 124, 2062. ; Yang (2014), Automatic Optical Inspection System for Surface Profile Measurement of Multi - Microlenses using Optimal Inspection Path, Measurement Science Technology, 25, 075006. ; Lin (2014), An Automatic Optical Inspection System for the Detection of Three Parallel Lines in Solar Panel End Face, Optik, 125, 688. ; Kihara (2012), Tool for inspecting faults from incorrectly cleaved fiber ends and contaminated optical fiber connector end surfaces Optical Fiber, Technology, 18, 470. ; Lin (2013), Automatic Optical Inspection System for the Micro - lens of Optical Connector with Fuzzy Ratio Analysis, Optik, 124, 3085. ; Fu (2014), Three - dimensional profile measurement of the blade based on multi - value coding, Optik, 125, 2592. ; Poon (1995), Comparison of surface roughness measurements by stylus profiler AFM and non - contact optical profiler, Wear, 190. ; Tien (2010), Measuring residual stress of anisotropic thin film by fast Fourier transform, Optics Express, 18, 16594. ; Garnaes (2003), Calibration of step heights and roughness measurements with atomic force microscopes, Precision Engineering, 27, 91. ; Chatterjee (2007), Measurement of surface figure of plane optical surfaces with polarization phase - shifting Fizeau interferometer and, Optics Laser Technology, 39, 268. ; Hu (2013), online measurement of spare parts with variable speed by using line - scan non - contact method, Optik, 124, 1472. ; Park (2008), Development of a new automatic gamma control system for mobile LCD applications, Displays, 29, 393. ; Macy (1983), Two - dimensional fringe - pattern analysis, Applied Optics, 22, 3898. ; Chow (2012), Design and characterization of largecore optical fiber for Light Peak applications, Opt Eng, 51, 015006.Polityka Open Access
Metrology and Measurement Systems is an open access journal with all content available with no charge in full text version.
The journal content is available under the license CC BY-NC-ND 4.0. https://creativecommons.org/licenses/by-nc-nd/4.0/