Details Details PDF BIBTEX RIS Title The problem of information leak due to parasitic loop currents and voltages in the KLJN secure key exchange scheme Journal title Metrology and Measurement Systems Yearbook 2019 Volume vol. 26 Issue No 1 Authors Melhem, Mutaz Y. ; Kish, Laszlo B. Keywords unconditional security ; key exchange ; parasitic loop currents and voltages ; information leak Divisions of PAS Nauki Techniczne Coverage 37-40 Publisher Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation Date 2019.04.01 Type Artykuły / Articles Identifier DOI: 10.24425/mms.2019.126335 ; e-ISSN 2300-1941 Source Metrology and Measurement Systems; 2019; vol. 26; No 1; 37-40 <div class="test"></div>