Tytuł artykułu

The problem of information leak due to parasitic loop currents and voltages in the KLJN secure key exchange scheme

Tytuł czasopisma

Metrology and Measurement Systems

Rocznik

2019

Wolumin

vol. 26

Numer

No 1

Autorzy

Melhem, Mutaz Y. ; Kish, Laszlo B.

Słowa kluczowe

unconditional security ; key exchange ; parasitic loop currents and voltages ; information leak

Wydział PAN

Nauki Techniczne

Zakres

37-40

Wydawca

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Data

2019.04.01

Typ

Artykuły / Articles

Identyfikator

DOI: 10.24425/mms.2019.126335 ; e-ISSN 2300-1941

Źródło

Metrology and Measurement Systems; 2019; vol. 26; No 1; 37-40

Polityka Open Access

Metrology and Measurement Systems is an open access journal with all content available with no charge in full text version.


The journal content is available under the license CC BY-NC-ND 4.0. https://creativecommons.org/licenses/by-nc-nd/4.0/