Details

Title

On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low-frequency noise measurements

Journal title

Metrology and Measurement Systems

Yearbook

2019

Volume

vol. 26

Numer

No 1

Authors

Keywords

low-frequency noise measurements ; electron devices reliability ; electro-migration ; dedicated instrumentation

Divisions of PAS

Nauki Techniczne

Coverage

13-21

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2019.04.01

Type

Artykuły / Articles

Identifier

DOI: 10.24425/mms.2019.126336 ; ISSN 0860-8229

Source

Metrology and Measurement Systems; 2019; vol. 26; No 1; 13-21
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