Details

Title

Ultra-low Power FinFET SRAM Cell with Improved Stability Suitable for Low Power Applications

Journal title

International Journal of Electronics and Telecommunications

Yearbook

2019

Volume

vol. 65

Issue

No 4

Authors

Keywords

FinFET ; RSNM ; WSNM ; Hold Margin ; Subthreshold ; Leakage Power

Divisions of PAS

Nauki Techniczne

Coverage

603-609

Publisher

Polish Academy of Sciences Committee of Electronics and Telecommunications

Date

2019.11.03

Type

Article

Identifier

DOI: 10.24425/ijet.2019.129819

Source

International Journal of Electronics and Telecommunications; 2019; vol. 65; No 4; 603-609
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