Details Details PDF BIBTEX RIS Title An assessment of applicability of the two-dimensional wavelet transform to assess the minimum chip thickness determination accuracy Journal title Metrology and Measurement Systems Yearbook 2020 Volume vol. 27 Issue No 4 Authors Gogolewski, Damian ; Makieła, Włodzimierz ; Nowakowski, Łukasz Keywords Wavelet analysis ; face milling ; minimum chip thickness ; surface texture Divisions of PAS Nauki Techniczne Coverage 659-672 Publisher Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation Date 2021.01.07 Type Article Identifier DOI: 10.24425/mms.2020.134845 Source Metrology and Measurement Systems; 2020; vol. 27; No 4; 659-672 <div class="test"></div>