Details

Title

An assessment of applicability of the two-dimensional wavelet transform to assess the minimum chip thickness determination accuracy

Journal title

Metrology and Measurement Systems

Yearbook

2020

Volume

vol. 27

Numer

No 4

Authors

Keywords

Wavelet analysis ; face milling ; minimum chip thickness ; surface texture

Divisions of PAS

Nauki Techniczne

Coverage

659-672

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2021.01.07

Type

Article

Identifier

DOI: 10.24425/mms.2020.134845
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