Details Details PDF BIBTEX RIS Title Wideband spectral emission measurements from laser-produced plasma EUV/SXR source based on a double gas puff target Journal title Metrology and Measurement Systems Yearbook 2020 Volume vol. 27 Issue No 4 Authors Arikkatt, Antony Jose ; Wachulak, Przemysław ; Fiedorowicz, Henryk ; Bartnik, Andrzej ; Czwartos, Joanna Keywords Plasma Spectroscopy ; X-ray coherence tomography ; soft X-ray Divisions of PAS Nauki Techniczne Coverage 701-719 Publisher Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation Date 2021.01.07 Type Article Identifier DOI: 10.24425/mms.2020.134848 Source Metrology and Measurement Systems; 2020; vol. 27; No 4; 701-719