Details

Title

Analog circuits specification driven testing by the means of digital stream and non-linear estimation model optimized evolutionarily

Journal title

Bulletin of the Polish Academy of Sciences: Technical Sciences

Yearbook

2020

Volume

68

Issue

No. 6

Authors

Keywords

analog electronic circuits ; specification driven testing ; evolutionary computations ; multiple regression

Divisions of PAS

Nauki Techniczne

Coverage

1283-1299

Date

31.12.2020

Type

Article

Identifier

DOI: 10.24425/bpasts.2020.135390

Source

Bulletin of the Polish Academy of Sciences: Technical Sciences; 2020; 68; No. 6; 1283-1299
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