Title

Study of Capacitor & Diode Aging effects on Output Ripple in Voltage Regulators and Prognostic Detection of Failure

Journal title

International Journal of Electronics and Telecommunications

Yearbook

2022

Volume

vol. 68

Issue

No 2

Affiliation

Sharma K, Preethi : Department of ECE, SJB Institute of Technology, Bengaluru, India ; Vijayakumar, T. : Department of ECE, SJB Institute of Technology, Bengaluru, India

Authors

Sharma K, Preethi ; Vijayakumar, T.

Keywords

buck ; MOSFET ; ESR ; SMPS ; voltage ripple

Divisions of PAS

Nauki Techniczne

Coverage

281-286

Publisher

Polish Academy of Sciences Committee of Electronics and Telecommunications

Date

2022.06.12

Type

Article

Identifier

DOI: 10.24425/ijet.2022.139879