Title

Sensor performance and cut-off wavelength tradeoffs of III-V focal plane arrays

Journal title

Opto-Electronics Review

Yearbook

2023

Volume

31

Issue

special issue

Affiliation

James, Jonathan Ch. : Electro-Optical Systems Laboratory, Georgia Tech Research Institute, 925 Dalney St. NW, Atlanta, GA 30332, USA ; Haran, Terence L. : Electro-Optical Systems Laboratory, Georgia Tech Research Institute, 925 Dalney St. NW, Atlanta, GA 30332, USA ; Lane, Sarah E. : Electro-Optical Systems Laboratory, Georgia Tech Research Institute, 925 Dalney St. NW, Atlanta, GA 30332, USA

Authors

James, Jonathan Ch. ; Haran, Terence L. ; Lane, Sarah E.

Keywords

infrared focal plane arrays ; III-V semiconductor infrared detector technologies ; infrared sensor performance modelling ; infrared sensor design ; mid-wave and long-wave infrared sensors

Divisions of PAS

Nauki Techniczne

Coverage

e144570

Publisher

Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology

Date

24.02.2023

Type

Article

Identifier

DOI: 10.24425/opelre.2023.144570