Title

Research on communication emitter identification based on semi-supervised dimensionality reduction in complex electromagnetic environment

Journal title

Bulletin of the Polish Academy of Sciences Technical Sciences

Yearbook

2023

Volume

71

Issue

4

Authors

Ge, Wei ; Qi, Lin ; Tong, Lin ; Zhu, Jun ; Zhang, Jing ; Zhao, Dongyang ; Li, Ke

Affiliation

Ge, Wei : School of Information & Computer Science, Anhui Agricultural University, Hefei, Anhui, 230036, China ; Ge, Wei : Information Materials and Intelligent Sensing Laboratory of Anhui Province, Anhui University, Hefei, Anhui, 230601, China ; Qi, Lin : School of Information & Computer Science, Anhui Agricultural University, Hefei, Anhui, 230036, China ; Qi, Lin : Information Materials and Intelligent Sensing Laboratory of Anhui Province, Anhui University, Hefei, Anhui, 230601, China ; Tong, Lin : School of Information & Computer Science, Anhui Agricultural University, Hefei, Anhui, 230036, China ; Tong, Lin : Information Materials and Intelligent Sensing Laboratory of Anhui Province, Anhui University, Hefei, Anhui, 230601, China ; Zhu, Jun : School of Information & Computer Science, Anhui Agricultural University, Hefei, Anhui, 230036, China ; Zhu, Jun : Information Materials and Intelligent Sensing Laboratory of Anhui Province, Anhui University, Hefei, Anhui, 230601, China ; Zhang, Jing : School of Information & Computer Science, Anhui Agricultural University, Hefei, Anhui, 230036, China ; Zhang, Jing : Information Materials and Intelligent Sensing Laboratory of Anhui Province, Anhui University, Hefei, Anhui, 230601, China ; Zhao, Dongyang : Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, ShenZhen, GuangDong, 518000, China ; Li, Ke : School of Information & Computer Science, Anhui Agricultural University, Hefei, Anhui, 230036, China ; Li, Ke : Information Materials and Intelligent Sensing Laboratory of Anhui Province, Anhui University, Hefei, Anhui, 230601, China

Keywords

communication emitter identification ; feature extraction ; dimensionality reduction ; VMD ; ESDA

Divisions of PAS

Nauki Techniczne

Coverage

e145766

Date

25.05.2023

Type

Article

Identifier

DOI: 10.24425/bpasts.2023.145766