Title

A probabilistic approach for approximation of optical and opto-electronic properties of an opto-semiconductor wafer under consideration of measuring inaccuracy and model uncertainty

Journal title

Opto-Electronics Review

Yearbook

2023

Volume

31

Issue

2

Authors

Stroka, Stefan M. ; Heumann, Christian ; Suhrke, Fabian ; Meindl, Kathrin

Affiliation

Stroka, Stefan M. : Department of Statistics, Faculty of Mathematics, Informatics and Statistics, LMU Munich, 80539 Munich, Germany ; Stroka, Stefan M. : ams-OSRAM International GmbH, 93055 Regensburg, Germany ; Heumann, Christian : Department of Statistics, Faculty of Mathematics, Informatics and Statistics, LMU Munich, 80539 Munich, Germany ; Suhrke, Fabian : ams-OSRAM International GmbH, 93055 Regensburg, Germany ; Meindl, Kathrin : ams-OSRAM International GmbH, 93055 Regensburg, Germany

Keywords

Gaussian process regression ; machine learning ; uncertainty quantification ; photoluminescence ; opto-semiconductor wafer measuring

Divisions of PAS

Nauki Techniczne

Coverage

e145863

Publisher

Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology

Date

12.05.2023

Type

Article

Identifier

DOI: 10.24425/opelre.2023.145863