Title

Application of nonlinear regression in the analysis of relaxation photocurrent waveforms

Journal title

Metrology and Measurement Systems

Yearbook

2023

Volume

vol. 30

Issue

No 4

Affiliation

Kaczmarek, Witold : Institute of Electronic Systems, Department of Electronics, Military University of Technology, ul. gen. Sylwestra Kaliskiego 2, 00-908 Warszawa, Poland ; Suproniuk, Marek : Institute of Electronic Systems, Department of Electronics, Military University of Technology, ul. gen. Sylwestra Kaliskiego 2, 00-908 Warszawa, Poland ; Piwowarski, Karol : Institute of Electronic Systems, Department of Electronics, Military University of Technology, ul. gen. Sylwestra Kaliskiego 2, 00-908 Warszawa, Poland ; Perka, Bogdan : Institute of Electronic Systems, Department of Electronics, Military University of Technology, ul. gen. Sylwestra Kaliskiego 2, 00-908 Warszawa, Poland ; Paziewski, Piotr : Institute of Electronic Systems, Department of Electronics, Military University of Technology, ul. gen. Sylwestra Kaliskiego 2, 00-908 Warszawa, Poland

Authors

Kaczmarek, Witold ; Suproniuk, Marek ; Piwowarski, Karol ; Perka, Bogdan ; Paziewski, Piotr

Keywords

defect centers ; semiconductor materials ; nonlinear regression method

Divisions of PAS

Nauki Techniczne

Coverage

605-616

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

16.11.2023

Type

Article

Identifier

DOI: 10.24425/mms.2023.147950