Details Details PDF BIBTEX RIS Title Hyperspectral imaging – a short review of methods and applications Journal title Metrology and Measurement Systems Yearbook 2023 Volume vol. 30 Issue No 4 Affiliation Kowalewski, Jędrzej : Scanway, Dunska 9, 54-427 Wrocław, Poland ; Zięba, Michał : Scanway, Dunska 9, 54-427 Wrocław, Poland ; Podgórski, Mikołaj : Scanway, Dunska 9, 54-427 Wrocław, Poland ; Kowalewski, Jędrzej : Wrocław University of Science and Technology, Faculty of Electronics, Photonics and Microsystems,Janiszewskiego 11/17, 50-372 Wrocław, Poland ; Domaradzki, Jarosław : Wrocław University of Science and Technology, Faculty of Electronics, Photonics and Microsystems,Janiszewskiego 11/17, 50-372 Wrocław, Poland ; Podgórski, Mikołaj : Wrocław University of Science and Technology, Faculty of Electronics, Photonics and Microsystems,Janiszewskiego 11/17, 50-372 Wrocław, Poland Authors Kowalewski, Jędrzej ; Domaradzki, Jarosław ; Zięba, Michał ; Podgórski, Mikołaj Keywords hyperspectral imaging ; spectral imaging ; observation methods ; infrared detector Divisions of PAS Nauki Techniczne Coverage 637-354 Publisher Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation Date 16.11.2023 Type Article Identifier DOI: 10.24425/mms.2023.147951