Tytuł artykułu

In-situ characterization of GaN material using Reflectance Spectroscopy

Tytuł czasopisma

Metrology and Measurement Systems

Rocznik

2025

Wolumin

vol. 32

Numer

No 1

Autorzy

Pokryszka, Piotr ; Kijaszek, Wojciech ; Patela, Sergiusz ; Stafiniak, Andrzej ; Wosko, Mateusz ; Paszkiewicz, Regina

Afiliacje

Pokryszka, Piotr : Wroclaw University of Science and Technology, Faculty of Electronics, Photonics and Microsystems, Janiszewskiego 11/17, 50-370 Wrocław, Poland ; Kijaszek, Wojciech : Wroclaw University of Science and Technology, Faculty of Electronics, Photonics and Microsystems, Janiszewskiego 11/17, 50-370 Wrocław, Poland ; Patela, Sergiusz : Wroclaw University of Science and Technology, Faculty of Electronics, Photonics and Microsystems, Janiszewskiego 11/17, 50-370 Wrocław, Poland ; Stafiniak, Andrzej : Wroclaw University of Science and Technology, Faculty of Electronics, Photonics and Microsystems, Janiszewskiego 11/17, 50-370 Wrocław, Poland ; Wosko, Mateusz : Wroclaw University of Science and Technology, Faculty of Electronics, Photonics and Microsystems, Janiszewskiego 11/17, 50-370 Wrocław, Poland ; Paszkiewicz, Regina : Wroclaw University of Science and Technology, Faculty of Electronics, Photonics and Microsystems, Janiszewskiego 11/17, 50-370 Wrocław, Poland

Słowa kluczowe

AIIIN ; MOVPE ; in-situ measurements ; reflectance spectroscopy ; optical properties

Wydział PAN

Nauki Techniczne

Zakres

1–12

Wydawca

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Data

10.04.2025

Typ

Article

Identyfikator

DOI: 10.24425/mms.2025.152780 ; ISSN 2080-9050, e-ISSN 2300-1941