Title

In-situ characterization of GaN material using Reflectance Spectroscopy

Journal title

Metrology and Measurement Systems

Yearbook

2025

Volume

vol. 32

Issue

No 1

Authors

Pokryszka, Piotr ; Kijaszek, Wojciech ; Patela, Sergiusz ; Stafiniak, Andrzej ; Wosko, Mateusz ; Paszkiewicz, Regina

Affiliation

Pokryszka, Piotr : Wroclaw University of Science and Technology, Faculty of Electronics, Photonics and Microsystems, Janiszewskiego 11/17, 50-370 Wrocław, Poland ; Kijaszek, Wojciech : Wroclaw University of Science and Technology, Faculty of Electronics, Photonics and Microsystems, Janiszewskiego 11/17, 50-370 Wrocław, Poland ; Patela, Sergiusz : Wroclaw University of Science and Technology, Faculty of Electronics, Photonics and Microsystems, Janiszewskiego 11/17, 50-370 Wrocław, Poland ; Stafiniak, Andrzej : Wroclaw University of Science and Technology, Faculty of Electronics, Photonics and Microsystems, Janiszewskiego 11/17, 50-370 Wrocław, Poland ; Wosko, Mateusz : Wroclaw University of Science and Technology, Faculty of Electronics, Photonics and Microsystems, Janiszewskiego 11/17, 50-370 Wrocław, Poland ; Paszkiewicz, Regina : Wroclaw University of Science and Technology, Faculty of Electronics, Photonics and Microsystems, Janiszewskiego 11/17, 50-370 Wrocław, Poland

Keywords

AIIIN ; MOVPE ; in-situ measurements ; reflectance spectroscopy ; optical properties

Divisions of PAS

Nauki Techniczne

Coverage

1–12

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

10.04.2025

Type

Article

Identifier

DOI: 10.24425/mms.2025.152780