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Signal processing for time resolved photoluminescence spectroscopy

Kacper Grodecki Krzysztof Murawski Jarosław Rutkowski Andrzej Kowalewski Jan Sobieski
Opto-Electronics Review | 2021 | 29 | 3 | 91-96 | DOI: 10.24425/opelre.2021.139038
Keywords epitaxy HgCdTe photoluminescence time resolved photoluminescence
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Abstract

Accurate determination of material parameters, such as carrier lifetimes and defect activation energy, is a significant problem in the technology of infrared detectors. Among many different techniques, using the time resolved photoluminescence spectroscopy allows to determine the narrow energy gap materials, as well as their time dynamics. In this technique, it is possible to observe time dynamics of all processes in the measured sample as in a streak camera. In this article, the signal processing for the above technique for Hg(1-x)CdxTe with a composition x of about 0.3 which plays an extremely important role in the mid-infrared is presented. Machine learning algorithms based on the independent components analysis were used to determine components of the analyzed data series. Two different filtering techniques were investigated. In the article, it is shown how to reduce noise using the independent components analysis and what are the advantages, as well as disadvantages, of selected methods of the independent components analysis filtering. The proposed method might allow to distinguish, based on the analysis of photoluminescence spectra, the location of typical defect levels in HgCdTe described in the literature.
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Authors and Affiliations

Kacper Grodecki
1
ORCID: ORCID
Krzysztof Murawski
1
ORCID: ORCID
Jarosław Rutkowski
1
ORCID: ORCID
Andrzej Kowalewski
1
ORCID: ORCID
Jan Sobieski
1
ORCID: ORCID
  1. Military University of Technology, 2 Kaliskiego St., Warsaw 00-908, Poland

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