Title

Noise Properties Of Thick-Film Conducting Lines For Integrated Inductors

Journal title

Metrology and Measurement Systems

Yearbook

2015

Volume

vol. 22

Issue

No 2

Authors

Stadler, Adam Witold ; Kolek, Andrzej ; Mleczko, Krzysztof ; Zawiślak, Zbigniew ; Dziedzic, Andrzej ; Nowak, Damian

Keywords

low-frequency noise ; thick-film conducting layer ; thick-film inductor

Divisions of PAS

Nauki Techniczne

Coverage

229-240

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2015[2015.01.01 AD - 2015.12.31 AD]

Type

Artykuły / Articles

Identifier

DOI: 10.1515/mms-2015-0021 ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2015; vol. 22; No 2; 229-240

References

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