Title

Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing - type NDT

Journal title

Archives of Electrical Engineering

Yearbook

2011

Volume

vol. 60

Issue

No 4 December

Authors

Putek, Piotr ; Crevecoeur, Guillaume ; Slodička, Marian ; Gawrylczyk, Konstanty ; van Keer, Roger ; Dupré, Luc

Keywords

defect characterization ; electromagnetic inverse problem ; two level optimization algorithms ; eddy current testing method ; sensitivity analysis

Divisions of PAS

Nauki Techniczne

Coverage

497-518

Publisher

Polish Academy of Sciences

Date

2011

Type

Artykuły / Articles

Identifier

DOI: 10.2478/v10171-011-0041-4 ; ISSN: 1427-4221 ; eISSN: 2300-2506

Source

Archives of Electrical Engineering; 2011; vol. 60; No 4 December; 497-518

References

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