Details

Title

Two Heuristic Algorithms for Test Point Selection in Analog Circuit Diagnoses

Journal title

Metrology and Measurement Systems

Yearbook

2011

Issue

No 1

Authors

Keywords

analog circuit diagnosis ; fault diagnosis ; testing ; search methods ; heuristic optimization

Divisions of PAS

Nauki Techniczne

Coverage

115-128

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2011

Type

Artykuły / Articles

Identifier

DOI: 10.2478/v10178-011-0011-6 ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2011; No 1; 115-128

References

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