Szczegóły Szczegóły PDF BIBTEX RIS Tytuł artykułu On the Bias of Terminal Based Gain and Offset Estimation Using the ADC Histogram Test Method Tytuł czasopisma Metrology and Measurement Systems Rocznik 2011 Numer No 1 Autorzy Alegria, F. ; Tiglao, Nestor Słowa kluczowe analog to digital converter ; histogram test method ; estimator bias ; terminal based ; gain ; offset Wydział PAN Nauki Techniczne Zakres 3-12 Wydawca Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation Data 2011 Typ Artykuły / Articles Identyfikator DOI: 10.2478/v10178-011-0001-8 ; ISSN 2080-9050, e-ISSN 2300-1941 Źródło Metrology and Measurement Systems; 2011; No 1; 3-12 Referencje IEEE. IEEE Standard for Digitizing Waveform Recorders-IEEE Std 1057-2007 (April 2008). <i>Institute of Electrical and Electronics Engineers. Inc.</i> ; Carbone P. (2000), Design of ADC sinewave histogram test, Computer Standards & Interfaces, 22, 239, doi.org/10.1016/S0920-5489(00)00044-1 ; Blair J. (1994), Histogram Measurement of ADC Non-linearities Using Sine Waves, IEEE Transactions on Instrumentation and Measurement, 43, 3, 373, doi.org/10.1109/19.293454 ; Chiorboli G. (2000), About the number of records to be acquired for histogram testing of ArD converters using synchronous sinewave and clock generators, Computer Standard & Interfaces, 22, 253, doi.org/10.1016/S0920-5489(00)00043-X ; F. Corrěa Alegria (2004), Error in the Estimation of Transition Voltages with the Standard Histogram Test of ADCs, Measurement. Elsevier Science, 35, 4, 389. ; Löhning M. (2007), The effects of aperture jitter and clock jitter in wideband ADCs, Computer Standards & Interfaces, 29, 11, doi.org/10.1016/j.csi.2005.12.005 ; Arpaia P. (2003), Characterization of digitizer timebase jitter by means of the Allan variance, Computer Standards & Interfaces, 25, 15, doi.org/10.1016/S0920-5489(02)00074-0 ; F. Corrěa Alegria (2006), The Histogram Test of ADCs is Unbiased by Phase Noise, null, 1639. ; F. Corrěa Alegria (2001), Influence of Frequency Errors in the Variance of the Cumulative Histogram, IEEE Transactions on Instrumentation and Measurements, 50, 2, 461, doi.org/10.1109/19.918166 ; F. Corrěa Alegria (2003), Variance of the Cumulative Histogram of ADCs due to Frequency Errors, IEEE Transactions on Instrumentation and Measurements, 52, 1, 69, doi.org/10.1109/TIM.2003.809083 ; Attivissimo F. (2007), Worst-case uncertainty measurement in ADC-based instruments, Computer Standards & Interfaces, 29, 5, doi.org/10.1016/j.csi.2005.12.002 ; Giaquinto N. (1998), Metrological qualification of data acquisition systems, Computer Standards & Interfaces, 19, 219, doi.org/10.1016/S0920-5489(98)00019-1 ; F. Corrěa Alegria (2009), Bias In ADC Terminal Based Gain and Offset Estimation Using the Histogram Method, null, 710. ; F. Corrěa Alegria (2006), ADC Transfer Function Types - A Review, Computer Standards & Interfaces. Elsevier, 28, 5, 553, doi.org/10.1016/j.csi.2005.07.003 ; F. Corrěa Alegria (2007), Standard Histogram Test Precision of ADC Gain and Offset Error Estimation, IEEE Transactions on Instrumentation and Measurement, 56, 5, 1527, doi.org/10.1109/TIM.2007.907978 ; Papoulis A. (1991), Probability, Random Variables and Stochastic Processes. ; "Agilent 33210A 10 MHz Function/Arbitrary Waveform Generator Data Sheet". (2008).