Title

A Novel Approach To Diagnosis Of Analog Circuit Incipient Faults Based On KECA And OAO LSSVM

Journal title

Metrology and Measurement Systems

Yearbook

2015

Volume

vol. 22

Issue

No 2

Authors

Zhang, Chaolong ; He, Yigang ; Zuo, Lei ; Wang, Jinping ; He, Wei

Keywords

analog circuits ; incipient fault diagnosis ; wavelet transform ; kernel entropy component analysis ; least squares support vector machine

Divisions of PAS

Nauki Techniczne

Coverage

251-262

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2015[2015.01.01 AD - 2015.12.31 AD]

Type

Artykuły / Articles

Identifier

DOI: 10.1515/mms-2015-0025 ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2015; vol. 22; No 2; 251-262

References

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