Details Details PDF BIBTEX RIS Title Study of the spatial distribution of minority carrier diffusion length in epiplanar detector structures Journal title Opto-Electronics Review Yearbook 2015 Volume vol. 23 Issue No 4 Authors Piotrowski, T. ; Węgrzecki, M. ; Stolarski, M. ; Gościński, K. ; Krajewski, T. Keywords effective minority diffusion length ; surface recombination velocity ; epiplanar detector ; p-n structures Divisions of PAS Nauki Techniczne Coverage 265-270 Publisher Polish Academy of Sciences and Association of Polish Electrical Engineers in cooperation with Military University of Technology Date 07.10.2015 Type Article Identifier ISSN 1896-3757 Source Opto-Electronics Review; 2015; vol. 23; No 4; 265-270 <div class="test"></div>