Szczegóły

Tytuł artykułu

Soft X-ray Diagnostic System Upgrades and Data Quality Monitoring Features for Tokamak Usage

Tytuł czasopisma

International Journal of Electronics and Telecommunications

Rocznik

2021

Wolumin

vol. 67

Numer

No 1

Autorzy

Afiliacje

Wojenski, Andrzej : Warsaw University of Technology, Institute of Electronics Systems, Poland ; Linczuk, Paweł : Warsaw University of Technology, Institute of Electronics Systems, Poland ; Kolasinski, Piotr : Warsaw University of Technology, Institute of Electronics Systems, Poland ; Chernyshova, Maryna : Institute of Plasma Physics and Laser Microfusion, Warsaw, Poland ; Mazon, Didier : CEA, Saint-Paul-lez-Durance, France ; Kasprowicz, Grzegorz : Warsaw University of Technology, Institute of Electronics Systems, Poland ; Pozniak, Krzysztof T. : Warsaw University of Technology, Institute of Electronics Systems, Poland ; Gaska, Michał : Warsaw University of Technology, Institute of Electronics Systems, Poland ; Czarski, Tomasz : Institute of Plasma Physics and Laser Microfusion, Warsaw, Poland ; Krawczyk, Rafał : Warsaw University of Technology, Institute of Electronics Systems, Poland ; Krawczyk, Rafał : CERN, Geneva, Switzerland

Słowa kluczowe

data quality monitoring ; FPGA ; Verilog/VHDL ; HDL ; GEM detector ; SXR plasma diagnostics ; modular measurement system ; data evaluation ; tokamak

Wydział PAN

Nauki Techniczne

Zakres

109-114

Wydawca

Polish Academy of Sciences Committee of Electronics and Telecommunications

Data

2021.02.17

Typ

Article

Identyfikator

DOI: 10.24425/ijet.2021.135951 ; eISSN 2300-1933 (since 2013) ; ISSN 2081-8491 (until 2012)

Źródło

International Journal of Electronics and Telecommunications; 2021; vol. 67; No 1; 109-114
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