Title

Analysis of Noise and Non-Linearity of I-V Characteristics of Positive Temperature Coefficient Chip Thermistors

Journal title

Metrology and Measurement Systems

Yearbook

2013

Issue

No 4

Authors

Grmela, Lubomír ; Sita, Zdenek ; Sedlakova, Vlasta ; Majzner, Jiri ; Sedlak, Petr ; Sikula, Josef

Keywords

PTC chip sensors ; noise spectroscopy ; I-V characteristic non-linearity ; quality evaluation

Divisions of PAS

Nauki Techniczne

Coverage

635-644

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2013

Type

Artykuły / Articles

Identifier

DOI: 10.2478/mms-2013-0054 ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2013; No 4; 635-644